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IPS09N03LA中文资料

P-TO252-3-11P-TO252-3-23P-TO251-3-11P-TO251-3-21

IPS09N03LA IPU09N03LA

Parameter

Symbol Conditions

Unit

min.

typ.

max.

Thermal characteristics

Thermal resistance, junction - case R thJC -- 2.4K/W

SMD version, device on PCB

R thJA

minimal footprint --756 cm 2 cooling area 5)

--50

Electrical characteristics, at T j =25 °C, unless otherwise specified Static characteristics

Drain-source breakdown voltage V (BR)DSS V GS =0 V, I D =1 mA 25--V

Gate threshold voltage V GS(th)V DS =V GS , I D =20 μA 1.2 1.62Zero gate voltage drain current

I DSS

V DS =25 V, V GS =0 V, T j =25 °C

-0.1

1

μA V DS =25 V, V GS =0 V, T j =125 °C

-10100Gate-source leakage current I GSS V GS =20 V, V DS =0 V -10100nA Drain-source on-state resistance

R DS(on)

V GS =4.5 V, I D =30 A -1215m ?

V GS =4.5 V, I D =30 A, SMD version -11.814.8V GS =10 V, I D =30 A -7.48.8V GS =10 V, I D =30 A, SMD version

-7.28.6Gate resistance R G -1-?Transconductance

g fs

|V DS |>2|I D |R DS(on)max , I D =30 A

23

46

-S 5)

Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2

(one layer, 70 μm thick) copper area for drain Values 2)

Current is limited by bondwire; with an R thJC =2.4 K/W the chip is able to carry 67 A.3)

See figure 3

4) T j,max =150 °C and duty cycle D <0.25 for V GS <-5 V

1)

J-STD20 and JESD22

IPS09N03LA IPU09N03LA Parameter Symbol Conditions Unit

min.typ.max. Dynamic characteristics

Input capacitance C iss-12351642pF Output capacitance C oss-474630 Reverse transfer capacitance C rss-6192

Turn-on delay time t d(on)-7.010ns Rise time t r- 5.68.4

Turn-off delay time t d(off)-2030

Fall time t f- 3.4 5.1

Gate Charge Characteristics6)

Gate to source charge Q gs- 4.3 5.7nC Gate charge at threshold Q g(th)- 2.0 2.6

Gate to drain charge Q gd- 2.8 4.3 Switching charge Q sw- 5.27.3

Gate charge total Q g-1013

Gate plateau voltage V plateau- 3.5-V

Gate charge total, sync. FET Q g(sync)V DS=0.1 V,

V GS=0 to 5 V

-8.712nC

Output charge Q oss V DD=15 V, V GS=0 V-1014 Reverse Diode

Diode continous forward current I S--50A Diode pulse current I S,pulse--350

Diode forward voltage V SD V GS=0 V, I F=50 A,

T j=25 °C

-0.97 1.2V

Reverse recovery charge Q rr V R=15 V, I F=I S,

d i F/d t=400 A/μs

--10nC

6) See figure 16 for gate charge parameter definition T C=25 °C

Values

V GS=0 V, V DS=15 V,

f=1 MHz

V DD=15 V, V GS=10 V,

I D=25 A, R G=2.7 ?

V DD=15 V, I D=25 A,

V GS=0 to 5 V

1 Power dissipation

5 Typ. output characteristics

9 Drain-source on-state resistance

13 Avalanche characteristics

IPS09N03LA IPU09N03LA Package Outline

P-TO252-3-11: Outline

Footprint:Packaging:

IPS09N03LA IPU09N03LA Package Outline

P-TO252-3-23: Outline

Footprint:

IPS09N03LA IPU09N03LA Package Outline

P-TO251-3-11: Outline

P-TO251-3-21: Outline

IPS09N03LA IPU09N03LA Published by

Infineon Technologies AG

Bereich Kommunikation

St.-Martin-Stra?e 53

D-81541 München

? Infineon Technologies AG 1999

All Rights Reserved.

Attention please!

The information herein is given to describe certain components and shall not be considered as

warranted characteristics.

Terms of delivery and rights to technical change reserved.

We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein.

Infineon Technologies is an approved CECC manufacturer.

Information

For further information on technology, delivery terms and conditions and prices, please contact your nearest Infineon Technologies office in Germany or our Infineon Technologies representatives worldwide (see address list).

Warnings

Due to technical requirements, components may contain dangerous substances.

For information on the types in question, please contact your nearest Infineon Technologies office. Infineon Technologies' components may only be used in life-support devices or systems with the expressed written approval of Infineon Technologies if a failure of such components can reasonably

be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted

in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail,

it is reasonable to assume that the health of the user or other persons may be endangered.

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