07/23/10
?This HEXFET ? Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable device for use in a wide variety of applications.
Description
l Advanced Process Technology l Ultra Low On-Resistance
l 175°C Operating Temperature l Fast Switching
l Repetitive Avalanche Allowed up to Tjmax Features
IRF3205ZPbF IRF3205ZSPbF IRF3205ZLPbF
D 2Pak IRF3205ZSPbF TO-220AB IRF3205ZPbF
TO-262IRF3205ZLPbF
l
Lead-Free
PD - 95129A
IRF3205ZS/LPbF
https://www.wendangku.net/doc/6817670137.html,
GS = 0V e DD = 25V
IRF3205ZS/LPbF
https://www.wendangku.net/doc/6817670137.html, 3
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics Fig 3. Typical Transfer Characteristics
Fig 4. Typical Forward Transconductance
Vs. Drain Current
I , D r a i n -t o -S o u r c e C u r r e n t (A )
I , D r a i n -t o -S o u r c e C u r r e n t (A )
V GS , Gate-to-Source Voltage (V)I D , D r a i n -t o -S o u r c e C u r r e n t ( A )
20
40
60
80
100
I D, Drain-to-Source Current (A)
20406080100120
G f s , F o r w a r d T r a n s c o n d u c t a n c e (S )
IRF3205ZS/LPbF
https://www.wendangku.net/doc/6817670137.html,
Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage Fig 7. Typical Source-Drain Diode
Forward Voltage
0.2
0.6
1.0
1.4
1.8
2.2
V SD , Source-toDrain Voltage (V)
0.1
1.0
10.0
100.0
1000.0I S D , R e v e r s e D r a i n C u r r e n t (A )
1
10
100
V DS , Drain-to-Source Voltage (V)
01000
2000
3000
4000
5000
6000
C , C a p a c i t a n c e (p F )
1
10
1001000
V DS , Drain-toSource Voltage (V)
0.1
1
10
100
1000
10000
I D , D r a i n -t o -S o u r c e C u r r e n t (A
)
20
40
60
80
100
120
Q G Total Gate Charge (nC)
04
8
12
16
20V
G S , G a t e -t o -S o u r c e V o l t a g e (V )
IRF3205ZS/LPbF
https://www.wendangku.net/doc/6817670137.html, 5
Fig 9. Maximum Drain Current Vs.
Case Temperature
Fig 10. Normalized On-Resistance
Vs. Temperature
25
50
75
100
125
150
175
T C , Case Temperature (°C)
020406080100120
I D , D r a i n C u r r e n t (A
)
-60-40-20
20406080100120140160180
T J , Junction Temperature (°C)
0.5
1.0
1.5
2.0
2.5
R D S (o n ) , D r a i n -t o -S o u r c e O n R e s i s t a n c e (N o r m a l i z e d )
IRF3205ZS/LPbF
6
https://www.wendangku.net/doc/6817670137.html,
V Fig 13b. Gate Charge Test Circuit
Fig 13a. Basic Gate Charge Waveform
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Fig 12a. Unclamped Inductive Test Circuit
I Fig 14. Threshold Voltage Vs. Temperature
V DD
25
50
75
100
125
150
175
Starting T J , Junction Temperature (°C)
050100150200250300350
E A S , S i n g
l e P u l s e A v a l a n c h e E n e r g y (m J )
-75-50-25
25
50
75
100125150175
T J , Temperature ( °C )
1.0
2.0
3.0
4.0
V
G S (t h ) G a t e t h r e s h o l d V o l t a g
e (V )
IRF3205ZS/LPbF
https://www.wendangku.net/doc/6817670137.html, 7
Fig 15. Typical Avalanche Current Vs.Pulsewidth
Fig 16. Maximum Avalanche Energy
Vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 15, 16:(For further info, see AN-1005 at https://www.wendangku.net/doc/6817670137.html,)1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a temperature far in excess of T jmax . This is validated for every part type.
2. Safe operation in Avalanche is allowed as long asT jmax is not exceeded.
3. Equation below based on circuit and waveforms shown in Figures 12a, 12b.
4. P D (ave) = Average power dissipation per single avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche).
6. I av = Allowable avalanche current.
7. ?T = Allowable rise in junction temperature, not to exceed T jmax (assumed as 25°C in Figure 15, 16). t av = Average time in avalanche. D = Duty cycle in avalanche = t av ·f
Z thJC (D, t av ) = Transient thermal resistance, see figure 11)
P D (ave) = 1/2 ( 1.3·BV·I av ) = D T/ Z thJC
I av = 2D T/ [1.3·BV·Z th ]E AS (AR) = P D (ave)·t av
tav (sec)
A v a l a n c h e C u r r e n t (A
)
25
50
75
100
125
150
175Starting T J , Junction Temperature (°C)
040
80
120
160
200
E A R , A v a l a n c h e E n e r g y (m J )
IRF3205ZS/LPbF
https://www.wendangku.net/doc/6817670137.html,
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET ? Power MOSFETs
* V GS = 5V for Logic Level Devices
V V d(on)
r
d(off)
f
V DD
Fig 18a. Switching Time Test Circuit
Fig 18b. Switching Time Waveforms
IRF3205ZS/LPbF
TO-220AB Package Outline
Dimensions are shown in millimeters (inches)
For the most current drawing please refer to IR website at https://www.wendangku.net/doc/6817670137.html,/package/
https://www.wendangku.net/doc/6817670137.html,
TO-262 Package Outline Dimensions are shown in millimeters (inches)
IRF3205ZS/LPbF
https://www.wendangku.net/doc/6817670137.html,
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at https://www.wendangku.net/doc/6817670137.html, for sales contact information . 07/2010
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11). Limited by T Jmax , starting T J = 25°C, L = 0.08mH R G = 25?, I AS = 66A, V GS =10V. Part not recommended for use above this value. Pulse width ≤ 1.0ms; duty cycle ≤ 2%. C oss eff. is a fixed capacitance that gives the same charging time as C oss while V DS is rising
from 0 to 80% V DSS .
Notes:
Limited by T Jmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance.
This value determined from sample failure population. 100% tested to this value in production. This is only applied to TO-220AB pakcage. This is applied to D 2Pak, when mounted on 1" square PCB (FR- 4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994.
3
4
4
TRR
FEED DIRECTION
1.85 (.073)
1.65 (.065)
1.60 (.063)1.50 (.059)
4.10 (.161)3.90 (.153)
TRL
FEED DIRECTION 10.90 (.429)10.70 (.421)
16.10 (.634)15.90 (.626)
1.75 (.069)1.25 (.049)
11.60 (.457)11.40 (.449)
15.42 (.609)15.22 (.601)
4.72 (.136)4.52 (.178)
24.30 (.957)23.90 (.941)
0.368 (.0145)0.342 (.0135)
1.60 (.063)1.50 (.059)
13.50 (.532)12.80 (.504)330.00(14.173) MAX.
27.40 (1.079)23.90 (.941)
60.00 (2.362) MIN.
30.40 (1.197) MAX.
26.40 (1.039)24.40 (.961)
NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
D 2Pak Tape & Reel Infomation
Dimensions are shown in millimeters (inches)