CS-11979
Chrysler Group LLC Document Number: CS-11979 Characteristic Standard Date Published: 2010-04-13 Category Code: L-2 Change Level: A EASL Requirement: No
Restricted: No
CHRYSLER/FIATELECTRICAL AND EMC PERFORMANCE REQUIREMENTS - E/E COMPONENTS 1.0 GENERAL
1.1 Purpose
This engineering standard defines the Electrical and Electromagnetic Compatibility (EMC) requirements for electronic components and subassemblies which contain electrical or electronic components for Chrysler/Fiat vehicles. These requirements have been developed to assure customer satisfaction and compliance with present and anticipated government regulations regarding the vehicle E/E systems and successful vehicle integration. These requirements are based on the international standards wherever possible.
Deviations from the component testing requirements contained in this standard are only allowed if explicitly agreed to and documented by the supplier and the appropriate Chrysler/Fiat Release and EMC Engineering Departments. The deviations are applicable only to the vehicle line(s) as specified in the individual part standard and/or detail part drawing as released by Chrysler/Fiat. This deviation information shall also be transmitted to the responsible electrical system or powernet group. Satisfactory performance in a vehicle is required for final approval of the vehicle component or system. It is the supplier’s responsibility to ensure that the current edition of this standard is used.
1.2 Coverage of this Standard
This document applies to passenger vehicles, light duty trucks, and medium duty trucks. This document shall be used in conjunction with CS-11980 Chrysler/Fiat EMC Performance Requirements - Vehicle. This standard shall apply to all electrical and electronic components and subassemblies sourced for joint Chrysler/Fiat Platforms. Should a conflict exist between this standard and any of the referenced documents, the requirements of this standard shall prevail except for regulatory requirements.
Chrysler/Fiat may change the specific requirements for a given component as a result of testing to this standard.
1.3 Limitations on Usage
This specification shall not supersede any applicable laws or regulations unless a specific exemption has been obtained.
1.4 Table of Contents
1.0GENERAL (1)
1.1Purpose (1)
1.2Coverage of this Standard (1)
1.3Limitations on Usage (1)
1.4Table of Contents (1)
2.0REQUIREMENTS (2)
2.1Requirements for EMC Test Planning and Test Selection Guide (2)
2.2Test Conditions (5)
2.3Function Performance Status Classification (FPSC) (5)
2.4Test Report and Statement (6)
3.0TEST CONDITIONS AND TOLERANCES (6)
4.0ELECTRICAL SYSTEM PERFORMANCE REQUIREMENT (7)
4.1Electrical System Operating Environment (7)
4.2Supply Voltage Variations (9)
4.3Supply Over Voltage and Reverse Voltage (13)
4.4Electrical System Compatibility Requirements (13)
5.0RF EMISSIONS (EMITTED DISTURBANCES) (15)
5.1CISPR-25 Conducted RF Emissions - (Voltage on Supply Lines) (16)
5.2CISPR-25 Conducted RF Emissions - (Current on all Lines in Harness) (17)
5.3CISPR-25 Radiated Emissions (18)
5.4Conducted Transient Emissions (20)
6.0RF IMMUNITY (20)
6.1Bulk Current Injection (BCI) Test (21)
6.2Absorber Lined Shielded Enclosure (ALSE) with or without a Ground Plane (22)
6.3Magnetic Field Immunity (25)
6.4Transient Immunity (27)
7.0ELECTROSTATIC DISCHARGE (ESD) (31)
7.1Test Setup (31)
7.2ESD, Operating Test (32)
8.0DEFINITIONS/ABBREVIATIONS/ACRONYMS (35)
9.0GENERAL INFORMATION (38)
10.0REFERENCES (38)
11.0ENGINEERING APPROVED SOURCE LIST (39)
12.0PUBLICATION INFORMATION (39)
ANNEX A : FUNCTION PERFORMANCE STATUS CLASSIFICATION EXAMPLES (INFORMATIVE) .. 40 ANNEX B : EMC TESTING AND TERMINATION INFORMATION FOR CAN AND LIN BUS SYSTEMS (INFORMATIVE) (43)
2.0 REQUIREMENTS
Performance Requirements - Vehicle. In the event that the DUT passes the component level requirements but does not pass the vehicle level EMC requirements, the vehicle level test results shall be the determining factor for validation test conformance / nonconformance status. All anomalies that occur during immunity testing shall be recorded with thresholds noted.
The DUT (Device Under Test) shall pass both the component level requirements according to this specification and the vehicle level EMC requirements according to CS-11980 Chrysler/Fiat EMC.
A minimum of two (2) design validation (DV) and one (1) production validation (PV) samples shall be tested.
All Validation testing must be performed at a laboratory that has received recognition through the Automotive EMC Laboratory Recognition Program (AEMCLRP) and is recognized by the Chrysler/Fiat EMC Committee. Chrysler/Fiat reserves the right to arrange for follow-up correlation tests and/or on site visits to evaluate the Chrysler/Fiat test methods and to further review and discuss the tests defined in the Chrysler/Fiat EMC Specifications. A laboratory which refuses such follow-up activities or for which significant discrepancies are found is subject to having its approval/recognition withdrawn.
2.1 Requirements for EMC Test Planning and Test Selection Guide***
A component Electrical and EMC test plan developed by the supplier shall be approved by Chrysler/Fiat prior to testing. Chrysler/Fiat test plan templates shall be used and are available from Chrysler/Fiat EMC Engineering. The completed test plan shall be reviewed by Chrysler product engineering and Chrysler EMC engineering. Once the test plan is found to be satisfactory, an approval number will be assigned to the test plan by the responsible Chrysler/Fiat EMC engineer. All test results must be accompanied by an
approved test plan. Any data submitted without this approval number will not be considered for product validation.
Classification tables for Electrical and EMC Test Selection in Tables 1, 2, and 3 are supplied as a guide for the selection of the minimum tests applicable to E/E components and subsystems. The result of Tables 1, 2, and 3 may not be all inclusive. The final list of required component tests will be determined by the Chrysler/Fiat component engineer and Chrysler/Fiat EMC engineer.
BM and EM components shall be operated at maximum speed for 3 minutes for each direction (if bidirectional) prior to any testing.
Bring about an impediment or severe trouble to vehicle control
Affect safety of passengers and/or of other road users
2.2 Test Conditions
All test equipment used for measurement shall be calibrated in accordance with ISO 17025. The default tolerances and test voltages are stated in applicable standards, unless required otherwise in this document.
The DUT for validation testing shall be production intent using production intent hardware and software.
A test fixture or DUT exerciser, provided by the supplier shall be used to electrically simulate the DUT vehicle system and shall exercise all of the required functions, communication bus and I/O of the DUT during all required tests. This system exerciser shall operate during the DUT testing without adverse effect. The system exerciser shall be able to simulate the appropriate load characteristics for all communications bus and I/O (i.e. equivalent resistance, capacitance and inductance) as expected in a production vehicle. Production intent components should be used for the inputs and loads including switches, sensors, pulse width modulated loads, solenoids and motors. Refer to Annex
B for termination information for CAN and LIN bus.
2.3 Function Performance Status Classification (FPSC)
For immunity testing, the required operation of vehicle electronic systems, when subjected to an electromagnetic/electrical stimulus, is described by M1 through M4 Classifications. Refer to Annex A for examples.
Device shall never perform an undesired operation (not included in requirement specification) enter a failure status not recoverable without service operation (e.g. battery disconnection).
The determination of deviation (anomaly) thresholds related to M1 – M4 Classifications shall be accomplished as follows:
RF level shall be lowered until the anomaly, or deviation, disappears.
RF level shall be incremented, by steps not exceeding 1 dB, until the anomaly reappears.
This last level is defined as the anomaly threshold.
2.4 Test Report and Statement
The test report shall follow ISO-17025 requirements. The test report shall include the following elements: Internal unique test report number.
Part number (hardware and software) and description of the DUT.
Date of test.
Facility name.
Requesting engineer.
Requesting division / company.
Type of test (Design Validation or Product Validation).
Copy of test plan with the approval number provided by Chrysler EMC engineer.
DUT Category from Test Selection Matrixes.
Any deletion from or addition to the test procedure.
Description of the DUT operation, mode of test, test setup and equipment used.
Photographs of each test setup.
Data and summary of data.
Equipment list and its calibration date.
The test report shall be provided as one complete document and not individual tests or parts.
3.0 TEST CONDITIONS AND TOLERANCES
Unless specified otherwise, the tolerances shall be according to Table 5:
Time interval 1s, length, energy, power
2 C
Unless indicated otherwise, the climatic test conditions shall be as defined in Table 6.
23 5 C (73 9 F)
4.0 ELECTRICAL SYSTEM PERFORMANCE REQUIREMENT
Voltage shall be applied to the battery and ignition (or switched) lines and any inputs or outputs sourced from the battery or ignition voltage as configured in the DUT’s complet e system (supply voltage lines). All input and output lines shall be connected to representative loads or networks to simulate the in-vehicle configuration.
4.1 Electrical System Operating Environment
4.1.1 Supply Voltage Range
This section defines the required operating voltage range by Functional Group for E/E components and systems. The test voltage shall be applied to all supply voltage lines (see definitions). Verify normal DUT operation at minimum and maximum supply voltage starting at the minimum voltage and at integral voltage values in between. The test duration shall be sufficient to verify the specified DUT functions at each voltage level.
4.1.1.1 Requirement
Components shall retain full functionality while performing within the defined voltage range, Functional Performance according to Table 7.
4.1.1.2 Test
For components driven by PWM signals, the power supply shall be configured using PWM signals with proper frequency and duty cycles. Three duty cycles shall be applied, minimum, medium, and maximum. If the test plan does not provide the duty cycle information, the default duty cycle values are 10%, 50% and 100%.
Supply voltage during this test is measured at the DUT connector
The test shall be performed at three different temperatures: 40 o C, 23 o C and T max. This is not intended to be a temperature shock test, therefore DUT shall be tested at 23 o C between the cold and hot test. The DUT shall be soaked in the temperature environment for 30 minutes minimum to stabilize the internal temperature of the DUT at the required temperature. This temperature soak shall be with the DUT unpowered. The test may be performed on the DUT outside of the chamber if this occurs within three minutes of removal from hot/cold soak. Table 8 describes the temperature levels to be used based on the component classification.
4.1.2 Ignition Off Draw (IOD)
This section applies to any electronic device with battery fed input line or lines. The purpose of these requirements is to control the consumption of electrical power after the ignition switch is turned off. For electric or other non-ignition vehicles, IOD refers to operating key off current draw. NOTE: Be aware that back feed paths from other circuits connected to the DUT in the vehicle may result in the vehicle design IOD for operating and shipping being exceeded. To preclude premature vehicle battery run down, any exceptions to the requirements of this section shall be reviewed and approved by the Chrysler/Fiat release engineer. This information shall also be transmitted to the responsible electrical system or powernet group. Table 9 describes the current draw levels to be used based on the component classification.
4.1.2.1 Requirement
4.1.2.2 Test
Allow sufficient time for the powered down DUT to reach sleep mode before conducting the test. With the DUT in the powered-down state or sleep mode and configured as a part of its complete system, measure the current draw of the DUT. The test shall be performed at both Ambient and 60 +/-5 o C after being soaked for 30 minutes at that temperature. The test may be performed on the DUT outside of the chamber if this occurs within three minutes of removal from hot soak.
4.1.3 Supply Voltage Ripple (Superimposed Alternating Voltage)
This test verifies immunity to supply voltage ripple. The voltage ripple shall be superimposed on the normal supply voltage of 12 V. Use the test set up as shown in ISO 16750-2006 Section 4.4 and severity level 2.
4.1.3.1 Requirement
M1 Performance for all Functional Groups
4.2 Supply Voltage Variations
Normal vehicle usage results in the on/off cycling of many electrical and electronic loads. These load changes cause rapid fluctuations of the vehicle supply voltage. These tests verify that the operation of the component is unaffected by dips and dropouts of the supply voltage. If the DUT is utilizing a data bus, no spurious messages shall be transmitted. All DUT inputs and outputs shall be connected to representative loads or networks to simulate the in-vehicle configuration. Functions are to be monitored during the tests to observe effect thresholds.
4.2.1 Sneak Path
This test validates component behavior when the supply voltage switch is turned off.
4.2.1.1 Requirement
When the ignition supply or ignition sense line(s) are turned off, the voltage on these lines shall fall below 1V within 1 sec. max.
4.2.1.2 Test
A test voltage of 13.5 V shall be applied to the DUT supply voltage lines. Turn the ignition supply or ignition sense line(s) off and measure the voltages on these lines. Five test cycles are required.
4.2.2 Supply Voltage Drop Out
4.2.2.1 Requirement
M 1 for drop outs 1 ms; M3 or better for drop outs > 1 ms for all functional classes.
No spurious or undesirable active response by the component is allowed.
4.2.2.2 Test
This test verifies normal operation of the DUT during brief supply voltage interruptions. The supply voltage shall drop out from 11 V to 0 V (open circuit) and return to 11 V. The duration of the drop out increases from 100 s to 2 s in increments as shown in Table 10. Test levels are set open circuit ( 1 kohm load) with fall time and rise time less than 10 s each. The DUT operation shall be monitored during the test and the interval time between dropouts shall be sufficient to verify normal DUT operation.
100 s to 1 ms 100 s
Minimum number of drop outs for each duration is 10.
Maximum time between drop outs shall be 5 s or response time of the DUT, whichever is greater.
4.2.3 Power Supply disconnection
Perform tests below on device and on each individual component (ECUs, actuators, etc.):
Single line interruption according ISO 16750-2:2006, 4.9.1 on all ground connections
Multiple line interruption according ISO 16750-2:2006, 4.9.1 on a connector at a time
During all tests, required behavior M3.
4.2.4 Reset Behavior at Voltage Drop
Test the device according ISO 16750-2:2006, 4.6.2. Us min according device classification. Required behavior M1 at Us min and minimum M3 at lower voltages.
4.2.5 Supply Voltage Dips
During the normal course of vehicle usage, many electrical and electronic devices are user activated, automatically controlled or are automatically controlling other loads in the electrical system. These load variations, or fuse activation, can result in rapid fluctuations of the supply voltage. Devices shall be immune to such voltage dips.
4.2.
5.1 Requirement
For FC2 devices: M1 for dips 0.25 ms; M3 or better for dips > 0.25 ms
For FC1 and FC0 devices: M1 for dips 1 ms; M3 or better for dips > 1 ms.
No spurious or undesirable active response by the component is allowed.
4.2.
5.2 Test
Voltage shall be applied to the supply voltage lines. A dip is from 11 V to the dip voltage for the specified duration and then back to 11 V. The dip voltages are: 5.5 V, 5.0 V, 4.5 V, 4.0 V and 3.5 V. Dips to each voltage level are for 0.1 ms, 0.25 ms, 1 ms, 10 ms and 500 ms durations, with fall time and rise time less than 50 s each (during the test). The DUT operation shall be monitored during the dip test and the interval time between dips shall be sufficient to verify normal DUT operation. At each dip voltage, run through the range of dip durations at least 5 times.
Each supply voltage line shall be dipped individually.
4.2.6 Engine Cranking Low Voltage – Resembling Cold Cranking
During starting (cranking of the engine) the battery voltage will fall to a low voltage for a short time period
and then rise slightly. Most components will be briefly energized just prior to cranking and some will be deactivated during the crank and subsequently re-energized after the start when the engine is running. This test verifies normal operation under these conditions. All inputs and outputs shall be connected to representative loads or networks to simulate the in-vehicle configuration.
4.2.6.1 Requirement
Functional Performance Status according to the Table 11.
There shall be no loss or corruption of the initialized or stored data.
4.2.6.2 Test
The test pulse is defined by Figure 1 and Table 11. This test applies to battery and ignition lines only and they shall be tested simultaneously. The DUT operation shall be monitored during the test. Return all DUT supply voltage lines to V B and confirm normal functionality after each test. This is one (1) cycle; ten (10) test cycles are required.
FIGURE 1: ENGINE CRANKING TEST PULSE
4.2.7 Engine Cranking Low Voltage – Warm cranking / Stop – Start
This test simulates the power supply conditions in the case of a warm cranking procedure f or the “Stop
-
Start” Function.
4.2.7.1 Requirement
This requirement is only valid for vehicles components equipped with Stop-Start Function.
4.2.7.2 Test
FIGURE 2: WARM CRANKING TEST SET-UP.
4.2.8 Slow Increase and Decrease of Supply Voltage
The purpose of this test is to verify that the component power up sequence is not adversely affected by a slow supply voltage ramp up or down.
4.2.8.1 Requirement
Test according ISO 16750-2:2006, 4.5. Required behavior according supply voltage range classification.
4.2.8.2 Test
The test shall be performed at ambient temperature.
4.3 Supply Over Voltage and Reverse Voltage
These requirements are to verify DUT immunity to higher than normal operating voltages and surges that may occur during a jump-start or certain failure modes of other components in the vehicle electrical system. All inputs and outputs shall be connected to representative loads or networks to simulate the in-vehicle configuration. Confirm normal functioning of the DUT at 13.5 V before and after each test. The DUT may shut down for protection outside its specified operating voltage range in according with component specification.
4.3.1 Defective Regulation (Full-Fielded Alternator) and Jump Start
4.3.1.1 Requirement
Defective Regulation: Apply 18V for one hour.
Jump Start: 24V for one minute.
4.3.2 Reverse Supply Voltage
4.3.2.1 Requirement
Test according ISO 16750-2:2006, section 4.7.2.3 (Case 2).
During test, device shall have minimum type M3 behavior.
Tests to be carried out in operating conditions agreed in the Technical Test Plan.
4.4 Electrical System Compatibility Requirements
The device shall be designed to individually withstand to continuous short circuit to ground and to positive supply on all power supplies, input lines and output lines, with M3 behavior on the shorted line and M1 behavior on all other lines and functions.
A protective response mechanism in the DUT may be triggered on the line under test.
A diagnostic error may be stored for the line under test.
The power supply for the short circuit tests shall be capable of maintaining between 13.5 V and 14.5 V during the test while supplying at least 100 A. A low ripple 50 A minimum power supply may be used in parallel with a fully charged automotive battery. Battery chargers are not an acceptable alternative.
All inputs and outputs shall be connected to representative loads or networks to simulate the in-vehicle configuration.
Test Voltage: 14 +/- 0.2 V
4.4.1 Immunity to Short Circuits in the Supply Voltage Input and Load Output Lines
Verify normal operation.
All supply voltage lines (including sourced output lines) are to individually survive connection to positive supply and/or a short to ground. Disconnect the power supply and connect the DUT supply input line to ground for at least 5 s. Remove the short to ground and return 13.5 V to confirm normal operation.
4.4.2 Immunity to Short Circuits in I/O Signal Lines
This test verifies the DUT’s immunity to short circuits in control and bus signal lines as well as in signal
I/O lines. All signal input and output lines shall be tested by short circuiting the individual lines to ground and to 13.5 V for at least 5 s. Paired control/bus signal lines shall remain permanently resistant to mutual short circuits as well as shorts to supply voltage and ground.
In case of technology limitation on outgoing signal ground (rated current lower than 250 mA) the Component Engineer may allow the following short circuit test.
Repeat the cycle in Figure 3, 5 (five) times with 1 min interval (t C) between 2 consecutive cycles.
FIGURE 3: SHORT CIRCUIT TEST ALTERNATIVE.
4.4.3 Immunity to Potential Differences Between Supplies
Perform tests below on device and on each individual component (ECUs, actuators, etc.):
A. Bring each individual device ground connection to +1V potential as to vehicle system ground and
check that device behaves as type M1.
B. Bring each individual device ground connection to -1V potential as to vehicle system ground and
check that device behaves as type M1.
C. Bring each individual device + supply connection to +1V potential as to vehicle system + supply and
check that device behaves as type M1.
D. Bring each individual device + supply connection to -1V potential as to vehicle system + supply and
check that device behaves as type M1.
In case a group of ground or + terminals are interconnected inside component with a route having resistance lower than 0.5 Ω, they might be con sidered as a single conductor and to not need to be tested.
Test shall be carried out as per Std. ISO 16750-2:2004; in this case, operating conditions and result assessment criteria shall be as per this Specification.
4.4.4 Motor Stall
4.4.4.1 Requirement
DUTs without an internal protection device: M1 for all Functional Groups.
DUTs with an internal protection device: M3 for all Functional Groups.
4.4.4.2 Test
The power supply for this test shall be capable of maintaining the voltage between 12.4 V and 12.8 V during the test while supplying at least 100 A. A low ripple 50 A minimum power supply may be used in parallel with a fully charged automotive battery. Battery chargers are not an acceptable alternative. Firmly mount the device housing so it cannot move. Lock the moveable part of the DUT so it cannot move or rotate. Supply 12.6 V to the feed line(s) of the DUT. Maintain this stall (or locked) condition for one (1) hour. Remove the supply voltage and return the DUT to a normal operating mode. If an internal protective device has been activated record the time for it to reset. Apply normal supply voltage and verify that there is no degradation of the DUT and that it performs as specified.
4.4.5 Insulation Resistance
Test according ISO 16750-2:2006, 4.12.
Insulati on resistance shall be > 1MΩ, unless otherwise defined by related Specification.
4.4.6 Breakdown Voltage
Test according ISO 16750-2:2006, 4.11.
Breakdown voltage shall be > 500 Vrms. unless otherwise required in related Specification.
5.0 RF EMISSIONS (EMITTED DISTURBANCES)
The RF emission measurements shall be performed to protect on board and off board receivers. The three test methods that shall be used are CISPR-25 Voltage, CISPR-25 Current, and CISPR-25 Radiated
Emissions. Prior to measurement of the DUT emissions, test setup ambient levels (i.e. DUT exerciser and load box energized without DUT) shall be measured and remain a minimum 6 dB below test limit levels. During DUT emissions measurements in operating modes, the DUT shall be configured to emit maximum emissions by using actual or simulated vehicle loads, e.g., motors, solenoids, proper PWM duty cycle circuits.
The measurement receiver shall be set such that the maximum frequency step size and minimum measurement times are defined in Table 16.
0.5 x BW
0.25 x BW
5 x BW
0.25 x BW
The use of a FFT Receiver requires the approval of the Chrysler/Fiat EMC Department. If an approved FFT Receiver is used and emissions exceed limit lines that portion that be tested again using conventional receiver measurements per the requirements above and included in the report.
The emissions measured are assumed to have both narrowband and broadband content, therefore the DUT shall meet all emissions limit levels for each frequency band defined in Tables 17 – 21.
All components shall comply with regulation 2004/104/EC and later (legal requirement for Europe).
5.1 CISPR-25 Conducted RF Emissions - (Voltage on Supply Lines)
The emissions shall be measured from 150 kHz to 108 MHz along power supply lines.
5.1.1 Test Setup
The test setup shall comply with the requirements of CISPR-25. The RF emissions for all power and ground lines (i.e., battery positive, battery negative, ignition, accessory, IOD) shall be measured. If the DUT has multiple power and/or ground lines they shall all be tied together to the same artificial network.
5.1.2 Requirement
The measuring receiver bandwidth and the limit values for terminal voltage are defined in Table 17.
5.2 CISPR-25 Conducted RF Emissions - (Current on all Lines in Harness)
The RF emissions shall be measured using a current probe from 10 kHz to 108 MHz on the DUT wire harnesses.
5.2.1 Test Setup
The test setup shall comply with the requirements of CISPR-25, with the following exceptions.
The DUT exerciser and load box shall be powered from the power supply directly.
The test harness shall be 1700 (+ 300, 0) mm long and routed 50 mm above the ground plane. All ground leads shall be taken out of the current probe.
Measurements shall be taken at two locations for all frequencies: 50 10 mm and 750 50 mm from
the DUT connector.
If a DUT is electrically bonded to the vehicle body during production through the case, the part shall
be placed directly on the ground plane and bonded with the ground plane.
5.2.2 Requirements
The measuring receiver bandwidth and the limit values for conducted current are defined in Table 18.
5.3 CISPR-25 Radiated Emissions
The RF emissions shall be measured from 150 kHz to 3000 MHz in an absorber-lined shielded enclosure (ALSE) for DUT circuit boards and wire harnesses.
5.3.1 Test Setup
The test setup shall comply with the requirements of CISPR-25. For frequencies above 1 GHz the phase center of the antenna shall be in line with the DUT (i.e. in front of the DUT instead of in front of the middle of the harness). The testing shall be conducted with the following orientations:
If the DUT has a display (instrument cluster, radio, clock, etc) that face shall be positioned out
towards antenna throughout the entire test.
For components completely sealed in a metal case, except for the connector, the DUT shall be
tested with the connector oriented towards the antenna.
5.3.2 Requirements
The measuring receiver bandwidth and the limit values for radiated emissions are defined in the Tables 19 – 21.
Limits for all components:
Limits for all components except Brush Commutated Motors:
Table 21 is applicable only to Brush Commutated Motors (in addition to 0.15-30 MHz table):
5.4 Conducted Transient Emissions
Motor and inductive devices (Category R or IP) shall be tested for conducted transients to ensure these devices are compatible with vehicle electronics.
5.4.1 Test Setup
The test setup shall comply with the requirements of ISO 7637-2 using the fast transient test method with the following exception; the shunt resistor R s shall not be installed. The DUT shall be under a loaded condition during test (i.e. seat motors require weights, wiper motors require friction) using the appropriate vehicle system switch or relay. The transients shall be measured using a storage scope (sampling rate of 1 giga samples per second minimum). The DUT shall be exercised by turning the DUT from off-to-on and on-to-off, during stall conditions and during rapid directional changes (bi-directional motor) utilizing a switch per ISO 7637-2:2004 and 300ns +/- 100ns switching time for current.
5.4.2 Requirement
The worst-case transients shall be recorded. Ten waveforms shall be captured and recorded for each configuration. The amplitude of the waveforms shall not exceed +/-80V.
6.0 RF IMMUNITY
The RF Immunity testing protects the vehicle components from conducted and radiated electromagnetic fields due to on-board and off-board transmitters. The immunity testing consists of the following three test methods: Bulk Current Injection (BCI, from 1 MHz – 400 MHz), Anechoic Chamber (ALSE, from 200 MHz -3.2 GHz) – with or without a ground plane and Magnetic Field Immunity (from 15 Hz – 30 kHz). The DUT operating test modes during test shall include functional mode, standby mode and sleep mode, if applicable.
The minimum dwell time for all immunity tests is two (2) seconds. Based on hardware or software design, if the DUT requires a longer dwell time for comprehensive testing, the supplier shall incorporate this increased dwell time into the DUT EMC test plan.
After immunity testing, the DUT I/O parametric values (e.g., IOD, resistance, capacitance, etc) shall remain within their specified tolerance.
All immunity tests shall be conducted with frequency steps listed in the Table 22.