RF1K49223
2.5A, 30V , 0.150 Ohm, Dual P-Channel LittleFET? Power MOSFET
The RF1K49223 Dual P-Channel power MOSFET is
manufactured using an advanced MegaFET process. This process, which uses feature sizes approaching those of LSI integrated circuits, gives optimum utilization of silicon,
resulting in outstanding performance. It is designed for use in applications such as switching regulators, switching
converters, motor drivers, relay drivers, and low voltage bus switches. This device can be operated directly from integrated circuits.
Formerly developmental type TA49223.
Features
? 2.5A,
30V ?r DS(ON) = 0.150?
?Temperature Compensating PSPICE ? Model ?Thermal Impedance PSPICE Model ?Peak Current vs Pulse Width Curve ?UIS Rating Curve
?Related Literature
-TB334 “Guidelines for Soldering Surface Mount Components to PC Boards”
Symbol
Packaging
JEDEC MS-012AA
Ordering Information
PART NUMBER PACKAGE BRAND
RF1K49223
MS-012AA
RF1K49223
NOTE:When ordering, use the entire part number. For ordering in tape and reel, add the suffix 96 to the part number, i.e. RF1K4922396.
G1(2)
D1(8)S1(1)D1(7)
D2(6)D2(5)
S2(3)G2(4)
BRANDING DASH
1
2
3
4
5
Data Sheet
January 2002
元器件交易网https://www.wendangku.net/doc/1f1899668.html,
Absolute Maximum Ratings T A= 25o C Unless Otherwise Specified
RF1K49223UNITS Drain to Source Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V DSS-30V Drain to Gate Voltage (R GS = 20k?) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V DGR-30V Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V GS±20V Drain Current
Continuous (Pulse Width = 5s). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I D Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I DM
2.5
Refer to Peak Current Curve
A
Pulsed Avalanche Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .E AS Refer to UIS Curve
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .P D Derate Above 25o C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2
0.016
W
W/o C
Operating and Storage Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T J, T STG-55 to 150o C Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T L Package Body for 10s, See Techbrief 334. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T pkg 300
260
o C
o C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.T J = 25o C to 125o C.
Electrical Specifications T A = 25o C, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS Drain to Source Breakdown Voltage BV DSS I D = 250μA, V GS = 0V, (Figure 12)-30--V Gate to Source Threshold Voltage V GS(TH)V GS = V DS, I D = 250μA, (Figure 11)-1--3V
Zero Gate Voltage Drain Current I DSS V DS = -30V,
V GS = 0V T A = 25o C---1μA T A = 150o C---50μA
Gate to Source Leakage Current I GSS V GS = ±20V--±100nA
Drain to Source On Resistance r DS(ON)I D = 2.5A,
(Figure 9, 10) V GS = -10V--0.150? V GS = -4.5V--0.360?
Turn-On Time t ON V DD = -15V, I D? 2.5A,
R L = 6?, V GS = -10V,
R GS = 25?--40ns
Turn-On Delay Time t d(ON)-9-ns Rise Time t r-19-ns Turn-Off Delay Time t d(OFF)-60-ns Fall Time t f-34-ns Turn-Off Time t OFF--140ns
Total Gate Charge Q g(TOT)V GS = 0V to -20V V DD = -24V,
I D? 2.5A,
R L = 9.6?
I g(REF) = -1.0mA
(Figure 14)-2835nC
Gate Charge at -10V Q g(-10)V GS = 0V to -10V-1519nC Threshold Gate Charge Q g(TH)V GS = 0V to -2V- 1.5 1.9nC
Input Capacitance C ISS V DS = -25V, V GS = 0V,
f = 1MHz
(Figure 13)-580-pF
Output Capacitance C OSS-260-pF Reverse Transfer Capacitance C RSS-38-pF Thermal Resistance Junction to Ambient RθJA Pulse Width = 1s
Device mounted on FR-4 material
--62.5o C/W Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS Source to Drain Diode Voltage V SD I SD = -2.5A---1.25V Reverse Recovery Time t rr I SD =-2.5A, dI SD/dt = 100A/μs--49ns
Typical Performance Curves
FIGURE 1.NORMALIZED POWER DISSIPATION vs AMBIENT
TEMPERATURE FIGURE 2.MAXIMUM CONTINUOUS DRAIN CURRENT vs
AMBIENT TEMPERATURE
FIGURE 3.NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
FIGURE 4.FORWARD BIAS SAFE OPERATING AREA FIGURE 5.PEAK CURRENT CAPABILITY
T A , AMBIENT TEMPERATURE (o C)
P O W E R D I S S I P A T I O N M U L T I P L I E R
00
25
5075100150
0.20.40.60.81.01.2125-1.5-0.5025
50
75100125150
-1.0-2.0I D , D R A I N C U R R E N T (A )
T A , AMBIENT TEMPERATURE (o C)
-3.0-2.5t, RECTANGULAR PULSE DURATION (s)
10-5
10-1100102
0.001
10
0.1
1
10-2
103
Z θJ A , N O R M A L I Z E D
T H E R M A L I M P E D A N C E
0.01
10-4
10-3
SINGLE PULSE
NOTES:
DUTY FACTOR: D = t 1/t 2
PEAK T J = P DM x Z θJA x R θJA + T A
P DM
t 1
t 2
101
DUTY CYCLE - DESCENDING ORDER 0.50.20.10.050.01
0.02V DS , DRAIN TO SOURCE VOLTAGE (V)
-1
-10
-100
-0.01
-1
-50
-10
-0.1-0.1
I D , D R A I N C U R R E N T (A )
DC
5ms 100ms
1s
10ms V DSS(MAX) = -30V
LIMITED BY r DS(ON)
AREA MAY BE
OPERATION IN THIS T J = MAX RATED T A = 25o C
t, PULSE WIDTH (s)
-100
-10
-110-5
10-410-310-210-1100101
I D M , P E A K C U R R E N T (A )
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
V GS = -10V
I = I 25
150 - T A 125
FOR TEMPERATURES
ABOVE 25o C DERATE PEAK CURRENT AS FOLLOWS:T A = 25o C
V GS = -20V
NOTE:Refer to Fairchild Application Notes AN9321 and AN9322.FIGURE 6.UNCLAMPED INDUCTIVE SWITCHING CAPABILITY
FIGURE 7.SATURATION CHARACTERISTICS
FIGURE 8.TRANSFER CHARACTERISTICS
FIGURE 9.DRAIN TO SOURCE ON RESISTANCE vs
GATE VOLTAGE AND DRAIN CURRENT
FIGURE 10.NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE FIGURE 11.NORMALIZED GATE THRESHOLD VOLTAGE vs
JUNCTION TEMPERATURE
110100
-10
0.1
-15-1I A S , A V A L A N C H E C U R R E N T (A )t AV , TIME IN AVALANCHE (ms)
t AV = (L)(I AS )/(1.3*RATED BV DSS - V DD )If R = 0
If R ≠ 0
t AV = (L/R)ln[(I AS *R)/(1.3*RATED BV DSS - V DD ) +1]
STARTING T J = 25o C
STARTING T J = 150o C
-4
-8
-12
0-1.5-3.0-4.5-6.0-7.5
-16
-20
I D , D R A I N C U R R E N T (A )
V DS , DRAIN TO SOURCE VOLTAGE (V)
V GS = -6V
V GS = -10V V GS = -20V PULSE DURATION = 80μs T A = 25o C
V GS = -5V V GS = -4.5V
V GS = -8V
DUTY CYCLE = 0.5% MAX
V GS = -7V 0
-4-6-8-10
-20
-4
-8
-12
-16
-20I D (O N ), O N -S T A T E D R A I N C U R R E N T (A )
V GS , GATE TO SOURCE VOLTAGE (V)
150o C
V DD = -15V
-55o C 25o C
PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX 100200
300
400
500
-6-4V GS , GATE TO SOURCE VOLTAGE (V)
r D S (O N ), D R A I N T O S O U R C E -2-8-10
I D = -0.625A O N R E S I S T A N C E (m ?)
PULSE DURATION = 80μs V DD = -15V
DUTY CYCLE = 0.5% MAX
I D = -1.25A
I D = -2.5A I D = -5.0A 00.5
1.01.5
2.0-80
-4004080120160
N O R M A L I Z E D D R A I N T O S O U R C E T J , JUNCTION TEMPERATURE (o C)
O N R E S I S T A N C E
PULSE DURATION = 80μs V GS = -10V, I D = -2.5A
DUTY CYCLE = 0.5% MAX -80
-40
04080120
160
0.40.6
0.8
1.0
1.2
N O R M A L I Z E D G A T E T J , JUNCTION TEMPERATURE (o C)
T H R E S H O L D V O L T A G E
V GS = V DS , I D = -250μA
FIGURE 12.NORMALIZED DRAIN TO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
FIGURE 13.CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
NOTE:Refer to Fairchild Application Notes AN7254 and AN7260.
FIGURE 14.NORMALIZED SWITCHING WAVEFORMS FOR CONSTANT GATE CURRENT
Test Circuits and Waveforms
FIGURE 15.UNCLAMPED ENERGY TEST CIRCUIT FIGURE 16.UNCLAMPED ENERGY WAVEFORMS
1.2
1.1
1.0
0.9
0.8-80
-40
04080120
160
T J , JUNCTION TEMPERATURE (o C)
N O R M A L I Z E D D R A I N T O S O U R C E B R E A K D O W N V O L T A G E
I D = -250μA
750
600
300
0-5-10-15-20-25
C , C A P A C I T A N C E (p F )
450
V DS , DRAIN TO SOURCE VOLTAGE (V)
150
C ISS
C OSS
C RSS
V GS = 0V, f = 1MHz C ISS = C GS + C GD C RSS = C GD
C OSS = C DS + C GD
V DD = BV DSS
V DD = 0.75 BV DSS V DD = 0.50 BV DSS V DD = 0.25 BV DSS
PLATEAU VOLTAGES IN DESCENDING ORDER:
R L = 12?
I G(REF) = -0.26mA V GS = -10V
-30.0
-22.5
-15.0
-7.5
20I G REF ()
I G ACT ()---------------------t, TIME (μs)
80I G REF ()
I G ACT ()----------------------10.0
-7.5
-5.0
-2.5
V D S , D R A I N T O S O U R C E V O L T A G E (V )V G S , G A T E T O S O U R C E V O L T A G E (V )
V DD = BV DSS
V DD = BV
DSS
t P
0.01?
L
I AS
+
-V DS
V DD
R G
DUT
VARY t P TO OBTAIN REQUIRED PEAK I AS 0V V GS
DSS
Soldering Precautions
The soldering process creates a considerable thermal stress on any semiconductor component. The melting temperature of solder is higher than the maximum rated temperature of the device. The amount of time the device is heated to a high temperature should be minimized to assure device reliability.Therefore, the following precautions should always be observed in order to minimize the thermal stress to which the devices are subjected.1.Always preheat the device.
2.The delta temperature between the preheat and solder-ing should always be less than 100o C. Failure to preheat the device can result in excessive thermal stress which can damage the device.
3.The maximum temperature gradient should be less than
5o C per second when changing from preheating to sol-dering.
4.The peak temperature in the soldering process should be
at least 30o C higher than the melting point of the solder chosen.5.The maximum soldering temperature and time must not
exceed 260o C for 10 seconds on the leads and case of the device.6.After soldering is complete, the device should be allowed
to cool naturally for at least three minutes, as forced cool-ing will increase the temperature gradient and may result in latent failure due to mechanical stress.7.During cooling, mechanical stress or shock should be
avoided.
FIGURE 17.SWITCHING TIME TEST CIRCUIT FIGURE 18.RESISTIVE SWITCHING WAVEFORMS
FIGURE 19.GATE CHARGE TEST CIRCUIT FIGURE 20.GATE CHARGE WAVEFORMS
V GS
R L
R GS
DUT
+
-V DD
V DS
V GS
t d(ON)
t r
90%
10%
V DS 90%
t f t d(OFF)
t OFF 90%
50%50%
10%
PULSE WIDTH
V GS t ON 10%
R L
V GS
+
-V DS
V DD
DUT
I g(REF)
PSPICE Electrical Model
SUBCKT RF1K49223 2 1 3 ;rev 4/7/97
CA 12 8 7.29e-10CB 15 14 5.01e-10CIN 6 8 5.55e-10
DBODY 5 7 DBODYMOD DBREAK 7 11 DBREAKMOD DPLCAP 10 6 DPLCAPMOD EBREAK 5 11 17 18 -35.46EDS 14 8 5 8 1EGS 13 8 6 8 1ESG 5 10 8 6 1
EVTHRES 6 21 19 8 1EVTEMP 6 20 18 22 1
IT 8 17 1
LDRAIN 2 5 1e-9LGATE 1 9 1.27e-9
LSOURCE 3 7 4.20e-10MMED 16 6 8 8 MMEDMOD MSTRO 16 6 8 8 MSTROMOD MWEAK 16 21 8 8 MWEAKMOD
RBREAK 17 18 RBREAKMOD 1RDRAIN 50 16 RDRAINMOD 19.3e-3RGATE 9 20 7.44RLDRAIN 2 5 10RLGATE 1 9 12.7RLSOURCE 3 7 4.2
RSLC1 5 51 RSLCMOD 1e-6RSLC2 5 50 1e3
RSOURCE 8 7 RSOURCEMOD 65.37e-3RVTHRES 22 8 RVTHRESMOD 1RVTEMP 18 19 RVTEMPMOD 1S1A 6 12 13 8 S1AMOD S1B 13 12 13 8 S1BMOD S2A 6 15 14 13 S2AMOD S2B 13 15 14 13 S2BMOD VBAT 22 19 DC 1
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*48),2.5))}
.MODEL DBODYMOD D (IS = 3.30e-13RS = 4.56e-2TRS1 =6.98e-4TRS2 =8.08e-7CJO = 8.21e-10TT = 3.51e-8 M=0.4).MODEL DBREAKMOD D (RS = 8.18e-1TRS1 =5.28e-3TRS2 = -7.18e-5.MODEL DPLCAPMOD D (CJO = 2.52e-10IS = 1e-30N = 10 M=0.6)
.MODEL MMEDMOD PMOS (VTO= -1.95 KP=0.75 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=7.44).MODEL MSTROMOD PMOS (VTO= -2.44 KP= 7.25 IS=1e-30 N=10 TOX=1 L=1u W=1u)
.MODEL MWEAKMOD PMOS (VTO= -1.68 KP=0.045 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=74.4 RS=0.1).MODEL RBREAKMOD RES (TC1 = 9.45e-4TC2 = -1.01e-7).MODEL RDRAINMOD RES (TC1 = 3.69e-3TC2 = 5.90e-6).MODEL RSLCMOD RES (TC1=3.46e-3 TC2= 1.26e-6)
.MODEL RSOURCEMOD RES (TC1=3.69e-3 TC2=5.90e-6).MODEL RVTHRESMOD RES (TC=-5.19e-4 TC2= 5.02e-6).MODEL RVTEMPMOD RES (TC1 = -3.54e-3TC2 = -6.53e-7).MODEL S1AMOD VSWITCH (RON = 1e-5ROFF = 0.1VON = 6.94VOFF= 3.94).MODEL S1BMOD VSWITCH (RON = 1e-5ROFF = 0.1VON = 3.94VOFF= 6.94).MODEL S2AMOD VSWITCH (RON = 1e-5ROFF = 0.1VON = 0.40VOFF= -2.60).MODEL S2AMOD VSWITCH (RON = 1e-5ROFF = 0.1
VON = -2.60VOFF= 0.40)
.ENDS
NOTE:For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options ;IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
1822
-++
-551
+
-
198+-1718
68
58
+-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17
18
1922
121315
S1A S1B
S2A S2B
CA
CB EGS
EDS
148138
1413MWEAK
DBODY
RSOURCE
SOURCE
11
7
3
LSOURCE RLSOURCE
CIN
RDRAIN EVTHRES 16
21
8
MMED
MSTRO
DRAIN 2
LDRAIN
RLDRAIN
DBREAK
DPLCAP
ESLC RSLC110
5
51
50
RSLC2
1
GATE RGATE EVTEMP
9
ESG LGATE
RLGATE
20
+-
+
-+
-
86
EBREAK
6
PSPICE Thermal Model
REV 28 Feb 97RF1K49223
CTHERM1 7 6 1.00e-7CTHERM2 6 5 9.00e-4CTHERM3 5 4 3.00e-3CTHERM4 4 3 4.00e-2CTHERM5 3 2 5.20e-3CTHERM6 2 1 1.90e-2RTHERM1 7 6 7.10e-2RTHERM2 6 5 1.90e-1RTHERM3 5 4 5.95e-1RTHERM4 4 3 4.27RTHERM5 3 2 1.2e1RTHERM6 2 1 1.04e2
RTHERM4RTHERM6RTHERM5RTHERM3RTHERM2RTHERM1
CTHERM4
CTHERM6
CTHERM5
CTHERM3
CTHERM2
CTHERM1
12
3
4
5
6
7
JUNCTION
CASE